2016 IEEE NSS/MIC Event

CAEN is proud to announce its presence at 2016 IEEE Nuclear Science Symposium and Medical Imaging Conference.
We’ll be in booths #38 and #39 (Central Hall).

The NSS/MIC is a well-established meeting that has continuously provided an exceptional venue to showcase outstanding developments and contributions across the nuclear and medical instrumentation fields. This conference brings together engineers and scientists from around the world to share their knowledge and to gain insight and inspiration from others. The conference will include a distinguished series of short courses, relevant refresher courses, and workshops that will address areas of particular interest.

In this event, CAEN will examine in depth several applications about
Advanced pulse processing for Timing and Spectroscopy.
Don’t miss our showcase Thursday, November 3 at 2:00 pm October 29 – November 6, 2016
Strasbourg, France
Web Site: http://2016.nss-mic.org/Schedule for the Technical Presentations